This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
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Radiation Effects & Soft Errors …(V34) (Selected Topics in Electronics and Systems)
$162.00
This book provides a detailed education on radiation effects in electronic devices at the material, device, and circuit levels.
Additional information
| Weight | 0.726 lbs |
|---|---|
| Dimensions | 16.8 × 2.3 × 24.9 in |
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